HTOL RF-Testsystems
High Temperature Operating Life

Systems for Lifetime Simulations of Electronic Components 


Testsystems for active & passive 5G-Components

-    High precision real-time monitoring of DUT insertion loss
-    Graphical user interface
-    Fully automatic test execution


TSQA-80PME HTOL Testing System

TSQA-80XME HTOL Testing System

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Product Portfolio Overview

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Becker Nachrichtentechnik GmbH offers industry leading turnkey solutions for fully automatic HTOL RF testing. The integrated test racks run complete test cycles using multiple RF frequencies without operator intervention. All devices under test (DUT) are exposed to a high-power, individually controlled, precise RF signal. The system continuously monitors the insertion loss of all DUTs in parallel and gives a transparent real-time progress status to the operator. This includes a system integrity status and statistical analysis of eventual violations of a predefined DUT tolerance specification. An integrated webserver allows the configuration and control of the system without any software development effort at the customer side.

Becker Nachrichtentechnik GmbH prides itself for a high-quality modular design concept that also allows to customize the HTOL RF test systems according to specific customer requirements. 

HTOL tests (High Temperature Operating Life) is an important element of reliability testing of microelectronic components. For radio frequency components, HTOL tests subject large batches of DUTs (devices under test) to RF stress at absolute maximum ratings and additionally to a high temperature of typically 125° C. The RF stress signals must be very precise and long term stable (1000 h and more) in order to create reliable statistics of the components’ life time. Devices under test that die from the stress during the HTOL test must not have any influence to neighbouring devices in the same test setup. Test systems from Becker Nachrichtentechnik GmbH have been designed specifically for this application and guarantee high isolation between stress signals and highly precise output levels with no overshoot. 





Latest modification: 06.07.2018